TTEP 2026
IEEE Computer Society
Test Technology Technical Council (TTTC)
Tutorials and Education Group (TEG)

Call for Tutorial Proposals

Test Technology Educational Program 2026
TTTC Logo
Overview

The Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2026 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The objective of this common call is to invite submissions for tutorial proposals in order to enable selecting the best fitted tutorials for each technical meeting, as part of the annual Test Technology Educational Program (TTEP).

The tutorials accepted by the Program Committee will be included in the Test Technology Educational Program, the intent of which is to serve the test and design professionals offering fundamental education and expert knowledge in state-of-the-art test technology topics.

Participation in TTEP-organized tutorials is accredited by Test Technology Technical Council. Each full day tutorial corresponds to four TTEP units (half day tutorial corresponds to two TTEP units). Upon completion of every sixteen units official accreditation in the form of the “IEEE TTTC Test Technology Certificate” is presented to the participants.

Technical Meetings

The TTEP 2026 tutorials program includes (but is not limited to) the following technical meetings:

International Test Conference India (ITC-India’26) International Test Conference (ITC’26) Asian Test Symposium (ATS’26) International Test Conference Asia (ITC-Asia’26) Latin American Test Symposium (LATS’27)

Topics of Interest

TTEP accommodates a wide range of technical areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. TTEP is soliciting new and updated tutorial proposals, as well as proposals for Test Clinics. The topics of interest for year 2026 TTEP Tutorials include (but are not limited to):

3D chiplet testing Artificial Intelligence for Test Automatic test equipment Board-level testing Built-In Self-Test Data analytics Defect oriented testing Design for testability Diagnosis and debug Embedded core testing Failure analysis techniques
Functional safety High-speed interface testing Memory testing Mixed-Signal/Analog testing Nanometer technology testing On-line and field testing Performance/Delay testing Microprocessor testing Power issues in testing Reliability and Automotive testing
Secure DfT System-level testing Test economics Test resource partitioning Test related standards Testing machine learning engines Verification and Validation Wafer testing Yield optimization and test

Submissions

All tutorial proposal submissions to TTEP 2026 are to be made electronically (in PDF format using the TTEP tutorial proposal template provided on both the TTEP main web site and the submission website) through the TTEP submissions website:

Deadline

Deadline for Tutorial Proposals March 15, 2026