TTEP 2026
IEEE Computer Society
Test Technology Technical Council (TTTC)
Tutorials and Education Group (TEG)

Test Technology Educational Program 2026

TTTC Logo
Group Mission

The mission of the Tutorials and Education Group (TEG) of TTTC is to provide opportunities for test technology professionals to update and expand their knowledge-base in test technology.

The Group strives to achieve these objectives by organizing:

  • Tutorials and courses offered through the Test Technology Educational Program (TTEP)
  • Tutorial articles in IEEE Computer Society newsletters, journals and magazines
  • E-tutorials through the IEEE Computer Society Web Site

About the Test Technology Educational Program

The Tutorials & Education Group of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes annually since 1999 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The tutorials are part of the successful annual Test Technology Educational Program. TTEP is intended to serve both test and design professionals by offering fundamental education and expert knowledge in state-of-the-art test technology topics and also the opportunity to earn official certification from IEEE TTTC.

TTEP accommodates a wide range of areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. Topics of interest include (but are not limited to):

3D chip testing Automatic test equipment Board-level testing Built-In Self-Test Defect oriented testing Design for testability DFT testers Diagnosis and debug Embedded core testing Failure analysis techniques
High-speed interface testing IC counterfeiting protection Interconnect characterization Memory testing Mixed-Signal/Analog testing Nanometer technology testing On-line and field testing Performance/Delay testing Microprocessor testing Power issues in testing
Reliability and Safety Secure DfT System-level testing Test data mining Test economics Test synthesis Test resource partitioning Test related standards Verification and Validation Wafer testing Yield optimization and test

Tutorials and Education Group Officers

TTEP Chair
Riccardo Cantoro
Politecnico di Torino, IT
riccardo.cantoro@polito.it
T: +39 011 090 7195
TTEP Vice Chair (Program)
Giusy Iaria
Politecnico di Torino, IT
giusy.iaria@polito.it
T: +39 011 090 7195